Thin Film Characteristics

This feature builds milt-layer film stacks, plots reflection, absorption and transmission. It plots reflection, absorption and transmission vs. angle, wavelength and layer thickness and inputs material models.

Thin Film modeling

Metrologia does thin film modeling. The user specifies the film stack geometry he wishes to simulate. The user must input material properties or choose materials from Metrologias database. Material constants (n and k) are modeled using 16 parameter models. A variety of model formulas are available and more will be added in the future. The user can also specify constant numerical values for n and k when a model is not available, and these can be used over limited wavelength ranges. Metrologia produces plots of reflection, absorption, or transmission as a function of wavelength or of angle of incidence. The plotted data can also be saved to text. Geometry setup files can be saved to disk for future use.